Test Beam Results of ATLAS Pixel Sensors
نویسنده
چکیده
Silicon pixel detectors produced according to the ATLAS Pixel Detector design were tested in a beam at CERN in the framework of the ATLAS collaboration. The detectors used n/n sensors with oxygenated silicon substrates. The experimental behaviour of the detectors after irradiation to 1.1 · 10 neq cmand 600 kGy is discussed. At the sensor bias voltage of 600 V the depleted depth is measured to be 229 μm, the mean collected charge is 20000 electrons, the detection efficiency is 98.2% and the spatial resolution is 9.6 μm.
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